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Wafer Test Systems realize high-precision electrical inspection of wafers. With stable testing performance and fast response, they detect defects efficiently to guarantee wafer quality. Flexible setups support diverse wafer sizes and test requirements.
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Wafer Test Systems
Fully Automatic Photonics Wafer Test System SA-WIT-220AL
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SKU:
SA-WIT-220AL
| Wafer Size | 2″~12″ |
|---|---|
| Loading Method | Automatic |
| Loading Type | Cassette/FOUP |
| Testing Capacity | 25~50 pcs/run |
| Wafer-ID | OCR-based automatic Wafer-ID recognition with Wafer Map generation |
| Auxiliary Chuck | Enables automatic probe cleaning, RF calibration, FA calibration, PD power/polarization calibration |
| Single-Probe Marking | Yes |
| Self-Cleaning | Yes (for wafer, Chuck, probes, FA) |
| Real-Time Height Sensing | Yes |
| Chuck Height Calibration | Yes |
| Chuck Positioning Accuracy | ±2µm |
| Temperature Range | -40~125℃ |