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Our Testing portfolio covers a full range of test tools for optoelectronic manufacturing. Built for high accuracy and stable operation, these tools perform diverse measurement and inspection tasks to verify product performance and meet strict production standards.
Fully Automatic Photonics Wafer Test System SA-WIT-220AL
In stock
SKU:
SA-WIT-220AL
| Wafer Size | 2″~12″ |
|---|---|
| Loading Method | Automatic |
| Loading Type | Cassette/FOUP |
| Testing Capacity | 25~50 pcs/run |
| Wafer-ID | OCR-based automatic Wafer-ID recognition with Wafer Map generation |
| Auxiliary Chuck | Enables automatic probe cleaning, RF calibration, FA calibration, PD power/polarization calibration |
| Single-Probe Marking | Yes |
| Self-Cleaning | Yes (for wafer, Chuck, probes, FA) |
| Real-Time Height Sensing | Yes |
| Chuck Height Calibration | Yes |
| Chuck Positioning Accuracy | ±2µm |
| Temperature Range | -40~125℃ |