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Wafer Test Systems realize high-precision electrical inspection of wafers. With stable testing performance and fast response, they detect defects efficiently to guarantee wafer quality. Flexible setups support diverse wafer sizes and test requirements.

Wafer Test Systems

Fully Automatic Photonics Wafer Test System SA-WIT-220AL

SKU: SA-WIT-220AL

In stock

Wafer Size2″~12″
Loading MethodAutomatic
Loading TypeCassette/FOUP
Testing Capacity25~50 pcs/run
Wafer-IDOCR-based automatic Wafer-ID recognition with Wafer Map generation
Auxiliary ChuckEnables automatic probe cleaning, RF calibration, FA calibration, PD power/polarization calibration
Single-Probe MarkingYes
Self-CleaningYes (for wafer, Chuck, probes, FA)
Real-Time Height SensingYes
Chuck Height CalibrationYes
Chuck Positioning Accuracy±2µm
Temperature Range-40~125℃